Explore the future of optical metrology with AI4Wave, our patented wavefront sensing technology. Easily integrating with your PSM (Point Source Microscope), AI4Wave adds advanced features that simplify your metrology process while maintaining the highest level of precision. It transforms your PSM into a powerful instrument, delivering accurate wavefront measurements across various optical surfaces, including aspheres.

For a quote, contact us at: customerservice@innovationsforesight.com or support@opticalperspectives.com.

Why AI4Wave?

• Unmatched Simplicity: Our AI4Wave technology takes the complexity out of wavefront measurements, making it effortless for you.
• Versatile Applications: Perfect for research, astronomy, medical imaging, optical manufacturing, and any field where optical precision matters.</h5p

Key Benefits:

• Low-cost, AI-driven wavefront sensing,
• Seamless customization and integration with your software and system,
• High Dynamic Range,
• Full surface data,
• Precision and sensitivity< 0.01 wave rms on Zernike coefficient,
• Allows you to output all optical measurements including wavefronts aberration, MTF, PSF and more.
• Robust against Vibration,
• Requires no additional hardware, just a single defocused image from your system,
• Mount anywhere you mount the PSM,
• Upgradeable to any optical workstation,
• PSM is the Swiss Army knife of optical surface alignment and metrology. Discover how the PSM, powered by AI4Wave, can make your work easier